Effect of Sm on YIG: Structural and dielectric properties evaluation

This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y3-xSmxFe5O12 (Smx; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG’s grain size (range 3.798 µm - 7.131 µm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (εr) from 15.4 to 17.5.