Effect of Sm on YIG: Structural and dielectric properties evaluation

Effect of Sm on YIG: Structural and dielectric properties evaluation

This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y3-xSmxFe5O12 (Smx; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such...

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Hauptverfasser: Ahmad, Hisyamuddin Hanif, Rejab, Nik Akmal, Ahmad, Zainal Arifin, Ain, Mohd Fadzil, Othman, Mohammadariff, Ali, Wan Fahmin Faiz Wan
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Dielectric properties
Hematite
Samarium
X-ray diffraction
Yttrium oxide
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creator Ahmad, Hisyamuddin Hanif
Rejab, Nik Akmal
Ahmad, Zainal Arifin
Ain, Mohd Fadzil
Othman, Mohammadariff
Ali, Wan Fahmin Faiz Wan
description This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y3-xSmxFe5O12 (Smx; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG’s grain size (range 3.798 µm - 7.131 µm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (εr) from 15.4 to 17.5.
doi_str_mv 10.1063/1.5089411
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subjects Dielectric properties
Hematite
Samarium
X-ray diffraction
Yttrium oxide
title Effect of Sm on YIG: Structural and dielectric properties evaluation
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