Crystal structure correlation of ferroelectric and dielectric properties of Nb doped PZT95/5

Pb(Zr 0.95 Ti 0.05 ) 1−x Nb x O 3 (x = 0.0, 0.02 and 0.025) polycrystalline ferroelectric (FE) ceramics were synthesized using conventional solid state method. The Rietveld refined X-ray diffraction pattern show all the compositions crystallize in the rhombohedral phase with R 3 c space group. The s...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2019-03, Vol.30 (5), p.5014-5020
Hauptverfasser:	Kumar, Manoj, Rai, Rajwant, Kumar, Naveen, Sharma, Gyaneshwar, Singh, Arun Kumar, Kumar, Sanjeev
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Coercivity Crystal structure Curie temperature Dielectric properties Diffraction patterns Doping Ferroelectric materials Ferroelectricity Materials Science Niobium Optical and Electronic Materials Permittivity Scanning electron microscopy Temperature dependence X-ray diffraction
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Zusammenfassung:	Pb(Zr 0.95 Ti 0.05 ) 1−x Nb x O 3 (x = 0.0, 0.02 and 0.025) polycrystalline ferroelectric (FE) ceramics were synthesized using conventional solid state method. The Rietveld refined X-ray diffraction pattern show all the compositions crystallize in the rhombohedral phase with R 3 c space group. The scanning electron microscopy result depicts the decrease in grain size with increase in niobium (Nb) doping. The temperature dependent dielectric permittivity shows the Nb doping increases the Curie temperature (T c ) and decreases the dielectric constant (ε r ) at T c . FE analysis shows doping of Nb increases the remnant polarization (P r ) and decreases the coercive field (E c ).
ISSN:	0957-4522 1573-482X
DOI:	10.1007/s10854-019-00798-z