Study of carbon-doped Mn^sub 3^Ga thin films with enhanced magnetization

Carbon-doped Mn3Ga thin films were grown on Si/SiO2 substrates using rf magnetron sputtering technique and they present an enhancement of their magnetization. In this work we focus on the structural stress, theoretical calculations and magnetization analysis (using both Bloch's and Kneller's laws). The residual stress component has been calculated by means of x-ray diffraction in gracing incidence, using the χ method for multiple crystallographic reflections. We have observed an increase of the cell volume or positive (tensile) strain, which is higher near the surface of the film. The existence of induced magnetism in Mn3GaC0.25, with C entering in interstitial positions has been investigated by first-principles calculations, using the projector-augmented-wave method, within the generalized gradient approximation. Spin charge distributions and magnetic moments associated with each ion, were analyzed by performing a Bader charge analysis. Noteworthily, in spite of being a thin film, the magnetic behavior of the sample can be well described considering it formed by magnetic nanoparticles. Magnetic field and temperature dependence of the magnetization measurements were used to evaluate the Bloch and Kneller exponents, showing that dipolar interactions take place between Mn3GaC0.25 nanoparticles.