Wire bonding of low-k devices

Purpose - The purpose of this paper is to review recent advances in wire bonding of low-k devices.Design methodology approach - Dozens of journal and conference articles published in 2005-2008 are reviewed.Findings - The paper finds that many articles have discussed and analysed problems challenges...

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Veröffentlicht in:Microelectronics international 2008-07, Vol.25 (3), p.19-25
1. Verfasser: Zhong, Z.W
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description Purpose - The purpose of this paper is to review recent advances in wire bonding of low-k devices.Design methodology approach - Dozens of journal and conference articles published in 2005-2008 are reviewed.Findings - The paper finds that many articles have discussed and analysed problems challenges such as bond pad metal peeling lift, non-sticking on pad, decreased bonding strength and lower wire-bond assembly yield. The paper discusses the articles' solutions to the problems and recent findings developments in wire bonding of low-k devices.Research limitations implications - Because of the page limitation, only brief discussions are given in this paper. Further reading is needed for more details.Originality value - The paper attempts to provide an introduction to recent developments and the trends in wire bonding of low-k devices. With the references provided, readers may explore more deeply by reading the original articles.
doi_str_mv 10.1108/13565360810889584
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source Emerald Journals
subjects Applied sciences
Cables
Design of experiments
Design. Technologies. Operation analysis. Testing
Dielectric properties
Electronics
Exact sciences and technology
Integrated circuits
Interfacial bonding
Performance evaluation
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Studies
Technology
Wire
title Wire bonding of low-k devices
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