Influence of rare earth material (Sm3+) doping on the properties of electrodeposited Cu2O films for optoelectronics

Herein, we report samarium (Sm) dopant concentration effect on Cu 2 O films characteristics prepared by electrodeposition method. XRD patterns of the films indicated that pristine and Sm:Cu 2 O films have polycrystalline cubic structure with ( 111 ) preferred orientation. It was seen from the SEM ph...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2019-02, Vol.30 (3), p.2530-2537
Hauptverfasser:	Ravichandiran, C., Sakthivelu, A., Deva Arun Kumar, K., Davidprabu, R., Valanarasu, S., Kathalingam, A., Ganesh, V., Shkir, Mohd, Algarni, H., AlFaify, S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Copper oxides Dopants Doping Luminous intensity Materials Science Optical and Electronic Materials Optoelectronics Photoelectric effect Photoelectric emission Photoluminescence Photosensitivity Pinholes Preferred orientation Raman spectroscopy Rare earth elements Samarium Spectrum analysis Thin films
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