Origin of the current-driven breakdown in vanadium oxides: Thermal versus electronic
We report the existence of two competing mechanisms in the current-driven electrical breakdown of vanadium sesquioxide (V2O3) and vanadium dioxide (VO2) nanodevices. Our experiments and simulations show that the competition between a purely electronic (PE) mechanism and an electrothermal (ET) mechan...
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| Veröffentlicht in: | Physical review. B 2018-11, Vol.98 (19), Article 195144 |
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| container_title | Physical review. B |
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| creator | Valmianski, I. Wang, P. Y. Wang, S. Ramirez, Juan Gabriel Guénon, S. Schuller, Ivan K. |
| description | We report the existence of two competing mechanisms in the current-driven electrical breakdown of vanadium sesquioxide (V2O3) and vanadium dioxide (VO2) nanodevices. Our experiments and simulations show that the competition between a purely electronic (PE) mechanism and an electrothermal (ET) mechanism, suppressed in nanoscale devices, explains the current-driven insulator-to-metal phase transition (IMT). We find that the relative contribution of PE and ET effects is dictated by thermal coupling and resistivity, a discovery which disambiguates a long-standing controversy surrounding the physical nature of the current-driven IMT in vanadium oxides. Furthermore, we show that the electrothermally driven IMT occurs through a nanoscopic surface-confined filament. This nanoconfined filament has a very large thermal gradient, thus generating a large Seebeck-effect electric field. |
| doi_str_mv | 10.1103/PhysRevB.98.195144 |
| format | Article |
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Y. ; Wang, S. ; Ramirez, Juan Gabriel ; Guénon, S. ; Schuller, Ivan K.</creator><creatorcontrib>Valmianski, I. ; Wang, P. Y. ; Wang, S. ; Ramirez, Juan Gabriel ; Guénon, S. ; Schuller, Ivan K.</creatorcontrib><description>We report the existence of two competing mechanisms in the current-driven electrical breakdown of vanadium sesquioxide (V2O3) and vanadium dioxide (VO2) nanodevices. Our experiments and simulations show that the competition between a purely electronic (PE) mechanism and an electrothermal (ET) mechanism, suppressed in nanoscale devices, explains the current-driven insulator-to-metal phase transition (IMT). We find that the relative contribution of PE and ET effects is dictated by thermal coupling and resistivity, a discovery which disambiguates a long-standing controversy surrounding the physical nature of the current-driven IMT in vanadium oxides. Furthermore, we show that the electrothermally driven IMT occurs through a nanoscopic surface-confined filament. This nanoconfined filament has a very large thermal gradient, thus generating a large Seebeck-effect electric field.</description><identifier>ISSN: 2469-9950</identifier><identifier>EISSN: 2469-9969</identifier><identifier>DOI: 10.1103/PhysRevB.98.195144</identifier><language>eng</language><publisher>College Park: American Physical Society</publisher><subject>Electric fields ; Electrical faults ; Nanotechnology devices ; Phase transitions ; Thermal coupling ; Vanadium dioxide ; Vanadium oxides</subject><ispartof>Physical review. 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We find that the relative contribution of PE and ET effects is dictated by thermal coupling and resistivity, a discovery which disambiguates a long-standing controversy surrounding the physical nature of the current-driven IMT in vanadium oxides. Furthermore, we show that the electrothermally driven IMT occurs through a nanoscopic surface-confined filament. 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| subjects | Electric fields Electrical faults Nanotechnology devices Phase transitions Thermal coupling Vanadium dioxide Vanadium oxides |
| title | Origin of the current-driven breakdown in vanadium oxides: Thermal versus electronic |
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