A Study of Beryllium-Based Materials and Comparison of Their X-Ray Homogeneities According to Small-Angle Scattering Data

A criterion for estimating the homogeneity of materials for refractive X-ray optics from small-angle X-ray scattering data is proposed. A material of new type—nanoberyllium—is considered. A number of samples of beryllium materials, including commercial products, have been analyzed. The X-ray homogen...

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Veröffentlicht in:Crystallography reports 2018-11, Vol.63 (6), p.874-882
Hauptverfasser: Semenov, A. A., Volkov, V. V., Zabrodin, A. V., Gorlevskii, V. V., Sheverdyaev, M. S., Lizunov, A. V., Brylev, D. A., Anikin, A. S., Demin, A. V., Nebera, A. L., Morozov, I. A., Lesina, I. G., Kozlova, E. V., Klykov, S. S., Kupriyanov, I. B., Zhidelev, A. I., Asadchikov, V. E., Buzmakov, A. V., Roshchin, B. S., Dadinova, L. A., Chekrygina, D. I., Amarantov, S. V., Zhigalina, O. M., Khmelenin, D. N., Senin, R. A., Veligzhanin, A. A., Aleksandrov, P. A.
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Sprache:eng
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Zusammenfassung:A criterion for estimating the homogeneity of materials for refractive X-ray optics from small-angle X-ray scattering data is proposed. A material of new type—nanoberyllium—is considered. A number of samples of beryllium materials, including commercial products, have been analyzed. The X-ray homogeneity of the materials is determined, as well as the influence of technological processes.
ISSN:1063-7745
1562-689X
DOI:10.1134/S1063774518060275