Pattern Classification for GIS Base on GK Clustering Algorithm

Four typical defects in GIS for PD detection are proposed, and the pulse, amplitude, phases, number of PD has been used to form the three-dimensional PQN matrix. Based on the PQN matrix, three two-dimensional distributions of Hqmax~Phi, Hqmean~Phi and Hn~Phi can be achieved. Then the new GK clusteri...

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Veröffentlicht in:	Applied Mechanics and Materials 2014-01, Vol.448-453, p.1955-1958
Hauptverfasser:	Wang, Hui, Li, Xiu Wei, Yun, Yu Xin, Yuan, Hai Yan
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Classification Clustering Defects Dielectric properties Normal distribution Pattern classification Validity
Online-Zugang:	Volltext
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