Surface atomic structure of epitaxial LaNiO3 thin films studied by in situ LEED-I(V)

We report in situ low-energy electron diffraction intensity versus voltage [LEED-I(V)] studies of the surface atomic structure of epitaxially grown (001)pc-oriented (pc=pseudocubic) thin films of the correlated 3d transition-metal oxide LaNiO3. Our analysis indicates the presence of large out-of-pla...

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Veröffentlicht in:	Physical review. B 2017-03, Vol.95 (11), p.115418
Hauptverfasser:	Ruf, J P, King, P D C, Nascimento, V B, Schlom, D G, Shen, K M
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic structure Earth surface Epitaxial growth Heterostructures Lanthanum oxides Low energy electron diffraction Rare earth elements Thin films Transition metal oxides Transition metals X-ray diffraction
Online-Zugang:	Volltext
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