Charge injection across a metal-organic interface suppressed by thermal diffusion
We find that the ohmic conductance of Co-phthalocyanine (CoPc) vertical capacitive devices is irreversibly suppressed by orders of magnitude when they are heated above 340 K. Detailed structural and transport studies imply that the changes in the conductance are due to diffusion of the top Pd electr...
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| Veröffentlicht in: | Applied physics letters 2014-01, Vol.104 (4) |
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| container_title | Applied physics letters |
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| creator | Monton, C. Saerbeck, T. Valmianski, I. Schuller, Ivan K. |
| description | We find that the ohmic conductance of Co-phthalocyanine (CoPc) vertical capacitive devices is irreversibly suppressed by orders of magnitude when they are heated above 340 K. Detailed structural and transport studies imply that the changes in the conductance are due to diffusion of the top Pd electrode into the CoPc layer. This leads to a decrease in Pd electrode effective work function, which increases the potential barrier for hole injection. |
| doi_str_mv | 10.1063/1.4863205 |
| format | Article |
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Detailed structural and transport studies imply that the changes in the conductance are due to diffusion of the top Pd electrode into the CoPc layer. This leads to a decrease in Pd electrode effective work function, which increases the potential barrier for hole injection.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.4863205</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Charge injection ; Diffusion layers ; Electrodes ; Palladium ; Potential barriers ; Resistance ; Thermal diffusion</subject><ispartof>Applied physics letters, 2014-01, Vol.104 (4)</ispartof><rights>2014 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c217t-875c921ce77f3cad4494667dc13e5c21ebb720a49375a2eaba4c1967569551b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27915,27916</link.rule.ids></links><search><creatorcontrib>Monton, C.</creatorcontrib><creatorcontrib>Saerbeck, T.</creatorcontrib><creatorcontrib>Valmianski, I.</creatorcontrib><creatorcontrib>Schuller, Ivan K.</creatorcontrib><title>Charge injection across a metal-organic interface suppressed by thermal diffusion</title><title>Applied physics letters</title><description>We find that the ohmic conductance of Co-phthalocyanine (CoPc) vertical capacitive devices is irreversibly suppressed by orders of magnitude when they are heated above 340 K. Detailed structural and transport studies imply that the changes in the conductance are due to diffusion of the top Pd electrode into the CoPc layer. This leads to a decrease in Pd electrode effective work function, which increases the potential barrier for hole injection.</description><subject>Applied physics</subject><subject>Charge injection</subject><subject>Diffusion layers</subject><subject>Electrodes</subject><subject>Palladium</subject><subject>Potential barriers</subject><subject>Resistance</subject><subject>Thermal diffusion</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNotkEFLw0AQhRdRMFYP_oMFTx5Sd3az2eQoRatQEKH3ZbKZtAltEneTQ_-9q-3pMfDNe7zH2COIJYhcvcAyK3Ilhb5iCQhjUgVQXLNECKHSvNRwy-5C6OKppVIJ-17t0e-It31HbmqHnqPzQwgc-ZEmPKSD32HfughM5Bt0xMM8jp5CoJpXJz7tyR_xwOu2aeYQDe7ZTYOHQA8XXbDt-9t29ZFuvtafq9dN6iSYKS2MdqUER8Y0ymGdZWWW56Z2oEhHhKrKSIFZqYxGSVhh5qDMjY4lNFRqwZ7OtqMffmYKk-2G2fcx0UqQxmgZ3yP1fKb-S3lq7OjbI_qTBWH_BrNgL4OpXwmtXMM</recordid><startdate>20140127</startdate><enddate>20140127</enddate><creator>Monton, C.</creator><creator>Saerbeck, T.</creator><creator>Valmianski, I.</creator><creator>Schuller, Ivan K.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20140127</creationdate><title>Charge injection across a metal-organic interface suppressed by thermal diffusion</title><author>Monton, C. ; Saerbeck, T. ; Valmianski, I. ; Schuller, Ivan K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c217t-875c921ce77f3cad4494667dc13e5c21ebb720a49375a2eaba4c1967569551b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Applied physics</topic><topic>Charge injection</topic><topic>Diffusion layers</topic><topic>Electrodes</topic><topic>Palladium</topic><topic>Potential barriers</topic><topic>Resistance</topic><topic>Thermal diffusion</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Monton, C.</creatorcontrib><creatorcontrib>Saerbeck, T.</creatorcontrib><creatorcontrib>Valmianski, I.</creatorcontrib><creatorcontrib>Schuller, Ivan K.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Monton, C.</au><au>Saerbeck, T.</au><au>Valmianski, I.</au><au>Schuller, Ivan K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Charge injection across a metal-organic interface suppressed by thermal diffusion</atitle><jtitle>Applied physics letters</jtitle><date>2014-01-27</date><risdate>2014</risdate><volume>104</volume><issue>4</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>We find that the ohmic conductance of Co-phthalocyanine (CoPc) vertical capacitive devices is irreversibly suppressed by orders of magnitude when they are heated above 340 K. Detailed structural and transport studies imply that the changes in the conductance are due to diffusion of the top Pd electrode into the CoPc layer. This leads to a decrease in Pd electrode effective work function, which increases the potential barrier for hole injection.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4863205</doi></addata></record> |
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| ispartof | Applied physics letters, 2014-01, Vol.104 (4) |
| issn | 0003-6951 1077-3118 |
| language | eng |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Applied physics Charge injection Diffusion layers Electrodes Palladium Potential barriers Resistance Thermal diffusion |
| title | Charge injection across a metal-organic interface suppressed by thermal diffusion |
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