Charge injection across a metal-organic interface suppressed by thermal diffusion

Charge injection across a metal-organic interface suppressed by thermal diffusion

We find that the ohmic conductance of Co-phthalocyanine (CoPc) vertical capacitive devices is irreversibly suppressed by orders of magnitude when they are heated above 340 K. Detailed structural and transport studies imply that the changes in the conductance are due to diffusion of the top Pd electr...

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Veröffentlicht in:Applied physics letters 2014-01, Vol.104 (4)
Hauptverfasser: Monton, C., Saerbeck, T., Valmianski, I., Schuller, Ivan K.
Format: Artikel
Sprache:eng
Schlagworte:
Applied physics
Charge injection
Diffusion layers
Electrodes
Palladium
Potential barriers
Resistance
Thermal diffusion
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Zusammenfassung:We find that the ohmic conductance of Co-phthalocyanine (CoPc) vertical capacitive devices is irreversibly suppressed by orders of magnitude when they are heated above 340 K. Detailed structural and transport studies imply that the changes in the conductance are due to diffusion of the top Pd electrode into the CoPc layer. This leads to a decrease in Pd electrode effective work function, which increases the potential barrier for hole injection.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4863205