Study of the electric-pulse-induced resistive switching effects at Pt/PrBa2Cu3Ox interfaces by multi-electrode method

Polycrystalline PrBa2Cu3Ox (PBCO) ceramic is prepared using the conventional solid-state reaction method and then Pt/PBCO/Pt plane structure device is fabricated. A reversible, non-volatile, and bipolar electric-pulse-induced resistance (EPIR) effect are found in the Pt/PBCO/Pt device. In order to determine the key role that controls the EPIR effect, the electrical properties of the Pt/PBCO interfaces and the temperature dependence of the PBCO bulk resistance are investigated by multi-electrode method. The results indicate that the EPIR effect is mainly induced and dominated by the Pt/PBCO interfaces, rather than the PBCO bulk. By analyzing the I–V characteristics of the contact interfaces, the carrier injection model is inferred to explain the EPIR effect.