Fabrication and characterization of a Au/PMMA/Sb metal-organic insulator-semiconductor junction
This work shows the growth and characterization of a Poly(methyl methacrylate) (PMMA)–Au heterostructure. The adsorption of a PMMA thin-film using layer-by-layer (LbL) technique was made on a Au thin-film formed by sputtering deposition on a glass substrate. Topographic, frictional effects and elect...
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | This work shows the growth and characterization of a Poly(methyl methacrylate) (PMMA)–Au heterostructure. The adsorption of a PMMA thin-film using layer-by-layer (LbL) technique was made on a Au thin-film formed by sputtering deposition on a glass substrate. Topographic, frictional effects and electrical characterizations were obtained using Scanning Probe Microscopy (SPM). Using the SPM silicon doped antimony probe as the semiconductor, a metal-organic insulator-semiconductor (MOIS) structure was characterized by its current-voltage curve showing a diode-like characteristic. |
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ISSN: | 0094-243X 1551-7616 |
DOI: | 10.1063/1.4878272 |