A random matrix approach to detect defects in a strongly scattering polycrystal: How the memory effect can help overcome multiple scattering
We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is used to capture the Green's matrix in a backscattering con...
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Veröffentlicht in: | Applied physics letters 2014-06, Vol.104 (23) |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is used to capture the Green's matrix in a backscattering configuration. Because of multiple scattering, conventional imaging completely fails to detect the deepest flaws. We utilize a random matrix approach, taking advantage of the deterministic coherence of the backscattered wave-field which is characteristic of single scattering and related to the memory effect. This allows us to separate single and multiple scattering contributions. As a consequence, we show that flaws are detected beyond the conventional limit, as if multiple scattering had been overcome. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.4882421 |