Design, Fabrication and Characterization of nanoplasmonic lattice for trapping of ultracold atoms
Ultracold atom-traps on a chip enhances the practical application of atom traps in quantum information processing, sensing, and metrology. Plasmon mediated near-field optical potentials are promising for trapping atoms. The combination of plasmonic nanostructures and ultracold atoms has the potentia...
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Veröffentlicht in: | arXiv.org 2018-10 |
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Sprache: | eng |
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Zusammenfassung: | Ultracold atom-traps on a chip enhances the practical application of atom traps in quantum information processing, sensing, and metrology. Plasmon mediated near-field optical potentials are promising for trapping atoms. The combination of plasmonic nanostructures and ultracold atoms has the potential to create a two dimensional array of neutral atoms with lattice spacing smaller than that of lattices created from interfering light fields -- the optical lattices. We report the design, fabrication and characterization of a nano-scale array of near-field optical traps for neutral atoms using plasmonic nanostructures. The building block of the array is a metallic nano-disc fabricated on the surface of an ITO-coated glass substrate. We numerically simulate the electromagnetic field-distribution using Finite Difference Time Domain method around the nanodisc, and calculate the intensity, optical potential and the dipole force for \(^{87}\)Rb atoms. The optical near-field generated from the fabricated nanostructures is experimentally characterized by using Near-field Scanning Optical Microscopy. We find that the optical potential and dipole force has all the desired characteristics to trap cold atoms when a blue-detuned light-field is used to excite the nanostructures. This trap can be used for effective trapping and manipulation of isolated atoms and also for creating a lattice of neutral atoms having sub-optical wavelength lattice spacing. Near-field measurements are affected by the influence of tip on the sub-wavelength structure. We present a deconvolution method to extract the actual near-field profile from the measured data. |
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ISSN: | 2331-8422 |