Charge transport in amorphous Hf0.5Zr0.5O2

Charge transport in amorphous Hf0.5Zr0.5O2

In this study, we demonstrated experimentally and theoretically that the charge transport mechanism in amorphous Hf0.5Zr0.5O2 is phonon-assisted tunneling between traps like in HfO2 and ZrO2. The thermal trap energy of 1.25 eV and optical trap energy of 2.5 eV in Hf0.5Zr0.5O2 were determined based o...

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Veröffentlicht in:Applied physics letters 2015-03, Vol.106 (10)
Hauptverfasser: Islamov, D. R., Perevalov, T. V., Gritsenko, V. A., Cheng, C. H., Chin, A.
Format: Artikel
Sprache:eng
Schlagworte:
Applied physics
Charge transfer
Charge transport
Correlation analysis
Crystals
Hafnium oxide
Zirconium dioxide
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Zusammenfassung:In this study, we demonstrated experimentally and theoretically that the charge transport mechanism in amorphous Hf0.5Zr0.5O2 is phonon-assisted tunneling between traps like in HfO2 and ZrO2. The thermal trap energy of 1.25 eV and optical trap energy of 2.5 eV in Hf0.5Zr0.5O2 were determined based on comparison of experimental data on transport with different theories of charge transfer in dielectrics. A hypothesis that oxygen vacancies are responsible for the charge transport in Hf0.5Zr0.5O2 was discussed.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4914900