Modeling electron cloud dynamics in high-frequency accelerators

The dynamics of electron cloud buildup, saturation, and dissipation represent a complex interaction between accelerator and beam parameters. In many accelerators bunch charges are large and beam frequencies are small. In this case electrons have a good probability of being accelerated to the opposit...

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Zusammenfassung:The dynamics of electron cloud buildup, saturation, and dissipation represent a complex interaction between accelerator and beam parameters. In many accelerators bunch charges are large and beam frequencies are small. In this case electrons have a good probability of being accelerated to the opposite side of the beam pipe before the next bunch crossing. If the time for electrons to drift across the beam pipe is less than the time to the next bunch crossing the cloud density can build up rapidly under this scenario. However, in accelerators where buch charges are small and beam frequencies are large, electrons created by secondary electron emission will not be accelerated to the opposite wall before the next bunch crossing. In this case the time for a cloud to build up is larger, but the amount of electron cloud that exists close to the beam may be increased.In this paper, we report simulation results for modeling of electron cloud buildup and dynamics in high-frequency accelerators. We model parameters relevant to the JLab Electron-Ion Collider (JLEIC) that is currently being designed. We consider beam frequencies up to 476 MHz for a variety of different ions, from protons up to Pb (82+), and with bunch charges ranging from 4.2 × 109 (p) to 0.05 × 109 (Pb) ions per bunch, and ion energies from 100 (p) - 40 (Pb) GeV/u. We compare simulations of electron cloud buildup and dynamics for these different cases, and contrast with similar simulations of proton-driven electron cloud buildup in the Fermilab recycler under the PIP-II upgrade scenario, with a frequency of 52.8 MHz, bunch charge of 80 × 109 p/bunch, and energies ranging from 8 - 20 GeV.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.4975864