Determination of deep trapping lifetime in organic semiconductors using impedance spectroscopy

A method for determining deep trapping lifetime in semiconductors using an impedance spectroscopy is proposed. A unique feature of the method is the simultaneous determination of the drift mobility and deep trapping lifetime in thin-film electronic devices. The validity of the proposed method is exa...

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Veröffentlicht in:	Applied physics letters 2016-02, Vol.108 (5), p.53305
Hauptverfasser:	Takagi, Kenichiro, Nagase, Takashi, Kobayashi, Takashi, Naito, Hiroyoshi
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS Drift Electronic devices ELECTRONIC EQUIPMENT HOLES Impedance spectroscopy LIFETIME MOBILITY ORGANIC SEMICONDUCTORS Semiconductors Service life assessment SPECTROSCOPY Spectrum analysis THIN FILMS TRAPPING
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Zusammenfassung:	A method for determining deep trapping lifetime in semiconductors using an impedance spectroscopy is proposed. A unique feature of the method is the simultaneous determination of the drift mobility and deep trapping lifetime in thin-film electronic devices. The validity of the proposed method is examined by numerical calculation. Simultaneous determinations of the drift mobility and deep trapping lifetime using this method are demonstrated in prototypical hole transporting organic semiconductors.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.4941235