Review of near-field optics and superlenses for sub-diffraction-limited nano-imaging

Near-field optics and superlenses for imaging beyond Abbe’s diffraction limit are reviewed. A comprehensive and contemporary background is given on scanning near-field microscopy and superlensing. Attention is brought to recent research leveraging scanning near-field optical microscopy with superlen...

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Veröffentlicht in:AIP Advances 2016-10, Vol.6 (10), p.100701-100701-17
Hauptverfasser: Adams, Wyatt, Sadatgol, Mehdi, Güney, Durdu Ö.
Format: Artikel
Sprache:eng
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Zusammenfassung:Near-field optics and superlenses for imaging beyond Abbe’s diffraction limit are reviewed. A comprehensive and contemporary background is given on scanning near-field microscopy and superlensing. Attention is brought to recent research leveraging scanning near-field optical microscopy with superlenses for new nano-imaging capabilities. Future research directions are explored for realizing the goal of low-cost and high-performance sub-diffraction-limited imaging systems.
ISSN:2158-3226
2158-3226
DOI:10.1063/1.4964498