Droplet-based, high-brightness extreme ultraviolet laser plasma source for metrology
We report on the development of a high brightness source of extreme ultraviolet radiation (EUV) with a working wavelength of 13.5 nm. The source is based on a laser-produced plasma driven by pulsed radiation of a Nd:YAG laser system. Liquid droplets of Sn-In eutectic alloy were used as the source fu...
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container_title | Journal of applied physics |
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creator | Vinokhodov, A. Yu Krivokorytov, M. S. Sidelnikov, Yu. V. Krivtsun, V. M. Medvedev, V. V. Koshelev, K. N. |
description | We report on the development of a high brightness source of extreme ultraviolet radiation (EUV) with a working wavelength of 13.5 nm. The source is based on a laser-produced plasma driven by pulsed radiation of a Nd:YAG laser system. Liquid droplets of Sn-In eutectic alloy were used as the source fuel. The droplets were created by a droplet generator operating in the jet break-up regime. The EUV emission properties of the plasma, including the emission spectrum, time profile, and conversion efficiency of laser radiation into useful 13.5 nm photons, have been characterized. Using the shadowgraphy technique, we demonstrated the production of corpuscular debris by the plasma source and the influence of the plasma on the neighboring droplet targets. The high-frequency laser operation was simulated by usage of the dual pulse regime. Based on the experimental results, we discuss the physical phenomena that could affect the source operation at high repetition rates. Finally, we estimate that an average source brightness of 1.2 kW/mm2 sr is feasible at a high repetition rate. |
doi_str_mv | 10.1063/1.4966930 |
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Yu ; Krivokorytov, M. S. ; Sidelnikov, Yu. V. ; Krivtsun, V. M. ; Medvedev, V. V. ; Koshelev, K. N.</creator><creatorcontrib>Vinokhodov, A. Yu ; Krivokorytov, M. S. ; Sidelnikov, Yu. V. ; Krivtsun, V. M. ; Medvedev, V. V. ; Koshelev, K. N.</creatorcontrib><description>We report on the development of a high brightness source of extreme ultraviolet radiation (EUV) with a working wavelength of 13.5 nm. The source is based on a laser-produced plasma driven by pulsed radiation of a Nd:YAG laser system. Liquid droplets of Sn-In eutectic alloy were used as the source fuel. The droplets were created by a droplet generator operating in the jet break-up regime. The EUV emission properties of the plasma, including the emission spectrum, time profile, and conversion efficiency of laser radiation into useful 13.5 nm photons, have been characterized. Using the shadowgraphy technique, we demonstrated the production of corpuscular debris by the plasma source and the influence of the plasma on the neighboring droplet targets. The high-frequency laser operation was simulated by usage of the dual pulse regime. Based on the experimental results, we discuss the physical phenomena that could affect the source operation at high repetition rates. Finally, we estimate that an average source brightness of 1.2 kW/mm2 sr is feasible at a high repetition rate.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.4966930</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Brightness ; Droplets ; Emission ; Eutectic alloys ; Extreme ultraviolet radiation ; Laser plasmas ; Lasers ; Neodymium lasers ; Photons ; Plasma ; Pulsed radiation ; Repetition ; Semiconductor lasers ; Ultraviolet lasers ; Ultraviolet radiation ; YAG lasers</subject><ispartof>Journal of applied physics, 2016-10, Vol.120 (16)</ispartof><rights>Author(s)</rights><rights>2016 Author(s). Published by AIP Publishing.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0001-9692-3042</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jap/article-lookup/doi/10.1063/1.4966930$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,4512,27924,27925,76384</link.rule.ids></links><search><creatorcontrib>Vinokhodov, A. Yu</creatorcontrib><creatorcontrib>Krivokorytov, M. S.</creatorcontrib><creatorcontrib>Sidelnikov, Yu. V.</creatorcontrib><creatorcontrib>Krivtsun, V. M.</creatorcontrib><creatorcontrib>Medvedev, V. V.</creatorcontrib><creatorcontrib>Koshelev, K. N.</creatorcontrib><title>Droplet-based, high-brightness extreme ultraviolet laser plasma source for metrology</title><title>Journal of applied physics</title><description>We report on the development of a high brightness source of extreme ultraviolet radiation (EUV) with a working wavelength of 13.5 nm. The source is based on a laser-produced plasma driven by pulsed radiation of a Nd:YAG laser system. Liquid droplets of Sn-In eutectic alloy were used as the source fuel. The droplets were created by a droplet generator operating in the jet break-up regime. The EUV emission properties of the plasma, including the emission spectrum, time profile, and conversion efficiency of laser radiation into useful 13.5 nm photons, have been characterized. Using the shadowgraphy technique, we demonstrated the production of corpuscular debris by the plasma source and the influence of the plasma on the neighboring droplet targets. The high-frequency laser operation was simulated by usage of the dual pulse regime. Based on the experimental results, we discuss the physical phenomena that could affect the source operation at high repetition rates. Finally, we estimate that an average source brightness of 1.2 kW/mm2 sr is feasible at a high repetition rate.</description><subject>Applied physics</subject><subject>Brightness</subject><subject>Droplets</subject><subject>Emission</subject><subject>Eutectic alloys</subject><subject>Extreme ultraviolet radiation</subject><subject>Laser plasmas</subject><subject>Lasers</subject><subject>Neodymium lasers</subject><subject>Photons</subject><subject>Plasma</subject><subject>Pulsed radiation</subject><subject>Repetition</subject><subject>Semiconductor lasers</subject><subject>Ultraviolet lasers</subject><subject>Ultraviolet radiation</subject><subject>YAG lasers</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNp90M1OAyEUBWBiNLFWF74BiTsjCsMAw9LU36SJm7omwEA7zUwZgTb27cW0iTs392y-3HNzAbgm-J5gTh_IfS05lxSfgAnBjUSCMXwKJhhXBDVSyHNwkdIaY0IaKidg8RTD2LuMjE6uvYOrbrlCJpaZNy4l6L5zdIOD2z5HvetCobAvNMKxxKBhCttoHfQhwsHlGPqw3F-CM6_75K6OOQWfL8-L2Ruaf7y-zx7naCzlGfG6lsYzYZj1NSdEMlpRTmhtWoMZbinTLRdWC10Z3RrurZWV5401grWmYnQKbg57xxi-ti5ltS7XbEqlqkhFmBCUiqJuDyrZLuvchY0aYzfouFcEq9-vKaKOX_sP70L8g2psPf0B5t5uqQ</recordid><startdate>20161028</startdate><enddate>20161028</enddate><creator>Vinokhodov, A. Yu</creator><creator>Krivokorytov, M. S.</creator><creator>Sidelnikov, Yu. V.</creator><creator>Krivtsun, V. M.</creator><creator>Medvedev, V. V.</creator><creator>Koshelev, K. N.</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-9692-3042</orcidid></search><sort><creationdate>20161028</creationdate><title>Droplet-based, high-brightness extreme ultraviolet laser plasma source for metrology</title><author>Vinokhodov, A. Yu ; Krivokorytov, M. S. ; Sidelnikov, Yu. V. ; Krivtsun, V. M. ; Medvedev, V. V. ; Koshelev, K. 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V.</creatorcontrib><creatorcontrib>Krivtsun, V. M.</creatorcontrib><creatorcontrib>Medvedev, V. V.</creatorcontrib><creatorcontrib>Koshelev, K. N.</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vinokhodov, A. Yu</au><au>Krivokorytov, M. S.</au><au>Sidelnikov, Yu. V.</au><au>Krivtsun, V. M.</au><au>Medvedev, V. V.</au><au>Koshelev, K. N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Droplet-based, high-brightness extreme ultraviolet laser plasma source for metrology</atitle><jtitle>Journal of applied physics</jtitle><date>2016-10-28</date><risdate>2016</risdate><volume>120</volume><issue>16</issue><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>We report on the development of a high brightness source of extreme ultraviolet radiation (EUV) with a working wavelength of 13.5 nm. The source is based on a laser-produced plasma driven by pulsed radiation of a Nd:YAG laser system. Liquid droplets of Sn-In eutectic alloy were used as the source fuel. The droplets were created by a droplet generator operating in the jet break-up regime. The EUV emission properties of the plasma, including the emission spectrum, time profile, and conversion efficiency of laser radiation into useful 13.5 nm photons, have been characterized. Using the shadowgraphy technique, we demonstrated the production of corpuscular debris by the plasma source and the influence of the plasma on the neighboring droplet targets. The high-frequency laser operation was simulated by usage of the dual pulse regime. Based on the experimental results, we discuss the physical phenomena that could affect the source operation at high repetition rates. Finally, we estimate that an average source brightness of 1.2 kW/mm2 sr is feasible at a high repetition rate.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.4966930</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0001-9692-3042</orcidid></addata></record> |
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subjects | Applied physics Brightness Droplets Emission Eutectic alloys Extreme ultraviolet radiation Laser plasmas Lasers Neodymium lasers Photons Plasma Pulsed radiation Repetition Semiconductor lasers Ultraviolet lasers Ultraviolet radiation YAG lasers |
title | Droplet-based, high-brightness extreme ultraviolet laser plasma source for metrology |
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