Analytical Electron Microscopy of Thin Film / Ionic Liquid Interfaces Prepared using a Focused Ion Beam

Analytical Electron Microscopy of Thin Film / Ionic Liquid Interfaces Prepared using a Focused Ion Beam

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2013-08, Vol.19 (S2), p.1636-1637
Hauptverfasser: Sloppy, J.D., Lang, A.C., Devlin, R., Ghassemi, H., Sichel-Tissot, R.J., May, S., Idrobo, J.C., Taheri, M.L.
Format: Artikel
Sprache:eng
Schlagworte:
Electron microscopy
Interfaces
Ion beams
Ionic liquids
Microscopy
P03.02 Imaging the Hard/Soft Materials Interface: Challenges and Solutions
Physical Sciences
Thin films
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927613010179