$Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction$

Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Bibliographische Detailangaben
Veröffentlicht in:	Microscopy and microanalysis 2013-08, Vol.19 (S2), p.704-705
Hauptverfasser:	Kuebel, C., Kobler, A., Gruber, P., Lohmiller, J., Kraft, O., Braun, C., Grewer, M., Birringer, R., Hahn, H.
Format:	Artikel
Sprache:	eng
Schlagworte:	A08.03 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research Deformation analysis Grain growth Instrumentation Sciences Nickel X-ray diffraction
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Beschreibung
Zusammenfassung:	Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
ISSN:	1431-9276 1435-8115
DOI:	10.1017/S1431927613005515