Getting Back to the Basics. Parameters that Must be Considered Before Attempting Quantitative EDS Analysis in the TEM

Getting Back to the Basics. Parameters that Must be Considered Before Attempting Quantitative EDS Analysis in the TEM

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Veröffentlicht in:Microscopy and microanalysis 2013-08, Vol.19 (S2), p.1074-1075
Hauptverfasser: Rowlands, N., Schumacher, E.F., Nicholls, A.W.
Format: Artikel
Sprache:eng
Schlagworte:
A13.05 Microscopy and Microanalysis for Real World Problem Solving
Instrumentation Sciences
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927613007368