Installation of Lau Interferometer into X-Ray Microscope system for Phase-CT Measurement

Installation of Lau Interferometer into X-Ray Microscope system for Phase-CT Measurement

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Veröffentlicht in:Microscopy and microanalysis 2018-08, Vol.24 (S2), p.188-189
Hauptverfasser: Takano, Hidekazu, Nagatani, Yukinori, Lian, Songzhe, Hashimoto, Koh, Wu, Yanlin, Momose, Atsushi
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Sprache:eng
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Computed tomography
INSTRUMENTATION & METHODS
New Instruments
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creator Takano, Hidekazu
Nagatani, Yukinori
Lian, Songzhe
Hashimoto, Koh
Wu, Yanlin
Momose, Atsushi
description
doi_str_mv 10.1017/S1431927618013296
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1435-8115
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source Cambridge University Press Journals Complete
subjects Computed tomography
INSTRUMENTATION & METHODS
New Instruments
title Installation of Lau Interferometer into X-Ray Microscope system for Phase-CT Measurement
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