$Correlation of Strain and Elemental Distribution at the Interface Using Simultaneous Energy-Filtered High-Speed 4D STEM Diffraction Imaging and EDS$

Correlation of Strain and Elemental Distribution at the Interface Using Simultaneous Energy-Filtered High-Speed 4D STEM Diffraction Imaging and EDS

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Bibliographische Detailangaben
Veröffentlicht in:	Microscopy and microanalysis 2018-08, Vol.24 (S1), p.168-169
Hauptverfasser:	Pakzad, Anahita, Longo, Paolo
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical and Instrumentation Science Symposia Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond Medical imaging
Online-Zugang:	Volltext
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