Temperature-dependent fine structure splitting in InGaN quantum dots

We report the experimental observation of temperature-dependent fine structure splitting in semiconductor quantum dots using a non-polar (11-20) a-plane InGaN system, up to the on-chip Peltier cooling threshold of 200 K. At 5 K, a statistical average splitting of 443 ± 132 μeV has been found based o...

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Veröffentlicht in:Applied physics letters 2017-07, Vol.111 (5)
Hauptverfasser: Wang, Tong, Puchtler, Tim J., Zhu, Tongtong, Jarman, John C., Kocher, Claudius C., Oliver, Rachel A., Taylor, Robert A.
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Sprache:eng
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Zusammenfassung:We report the experimental observation of temperature-dependent fine structure splitting in semiconductor quantum dots using a non-polar (11-20) a-plane InGaN system, up to the on-chip Peltier cooling threshold of 200 K. At 5 K, a statistical average splitting of 443 ± 132 μeV has been found based on 81 quantum dots. The degree of fine structure splitting stays relatively constant for temperatures less than 100 K and only increases above that temperature. At 200 K, we find that the fine structure splitting ranges between 2 and 12 meV, which is an order of magnitude higher than that at low temperatures. Our investigations also show that phonon interactions at high temperatures might have a correlation with the degree of exchange interactions. The large fine structure splitting at 200 K makes it easier to isolate the individual components of the polarized emission spectrally, increasing the effective degree of polarization for potential on-chip applications of polarized single-photon sources.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.4996861