Analysis of beam deflection measurements in the presence of linear absorption

Analysis of beam deflection measurements in the presence of linear absorption

We develop a series of analytical approximations allowing for rapid extraction of the nonlinear parameters from beam deflection measurements. We then apply these approximations to the analysis of cadmium silicon phosphide and compare the results against previously published parameter extraction meth...

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Veröffentlicht in:Optical materials express 2017-05, Vol.7 (5), p.1598
Hauptverfasser: Ferdinandus, Manuel R., Reed, Jennifer M., Averett, Kent L., Hopkins, F. Kenneth, Urbas, Augustine
Format: Artikel
Sprache:eng
Schlagworte:
Deflection
Parameters
Phosphides
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Beschreibung
Zusammenfassung:We develop a series of analytical approximations allowing for rapid extraction of the nonlinear parameters from beam deflection measurements. We then apply these approximations to the analysis of cadmium silicon phosphide and compare the results against previously published parameter extraction methods and find good agreement for typical experimental conditions.
ISSN:2159-3930
2159-3930
DOI:10.1364/OME.7.001598