The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

In this paper, the solution of the problem of identification of thermal properties of investigated multi-layer structure is presented. In order of that, artificial neural network was used to find the set of thermal properties for which the complex contrast characteric derived fits the best to the on...

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Veröffentlicht in:arXiv.org 2007-09
Hauptverfasser: Suszynski, Z, Kosikowski, M, Duer, R
Format: Artikel
Sprache:eng
Schlagworte:
Artificial neural networks
Multilayers
Neural networks
Thermodynamic properties
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Zusammenfassung:In this paper, the solution of the problem of identification of thermal properties of investigated multi-layer structure is presented. In order of that, artificial neural network was used to find the set of thermal properties for which the complex contrast characteric derived fits the best to the one evaluated basing upon experimenatal data.
ISSN:2331-8422