A New Type 'Magnetic-field' Probe of High Spatial-resolution Based on a Single-layer Flat-coil Method

A New Type 'Magnetic-field' Probe of High Spatial-resolution Based on a Single-layer Flat-coil Method

A radically new approach to surface probing based on a replacement of the solid-state near-field probes by the 'long-field' ones is presented and discussed. Such probes may enable to create a radically new generation microscopes with non-perturbing long-range action probe based on a highly...

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Veröffentlicht in:arXiv.org 2005-04
Hauptverfasser: Gevorgyan, S G, Azaryan, M G
Format: Artikel
Sprache:eng
Schlagworte:
Coils
Microscopes
Test procedures
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Zusammenfassung:A radically new approach to surface probing based on a replacement of the solid-state near-field probes by the 'long-field' ones is presented and discussed. Such probes may enable to create a radically new generation microscopes with non-perturbing long-range action probe based on a highly sensitive RF test method with a single-layer flat coil. This may give a start for creation of a new direction in microscopy.
ISSN:2331-8422