Quantitative analysis of the critical current due to vortex pinning by surface corrugation

The transport critical current of a Niobium (Nb) thick film has been measured for a large range of magnetic field. Its value and variation are quantitatively described in the framework of the pinning of vortices due to boundary conditions at the rough surface, with a contact angle well explained by...

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Veröffentlicht in:arXiv.org 2004-04
Hauptverfasser: Pautrat, Alain, Scola, J, Goupil, C, Simon, Ch, Villard, C, Domenges, B, Simon, Y, Guilpin, Ch, Mechin, L
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Sprache:eng
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Zusammenfassung:The transport critical current of a Niobium (Nb) thick film has been measured for a large range of magnetic field. Its value and variation are quantitatively described in the framework of the pinning of vortices due to boundary conditions at the rough surface, with a contact angle well explained by the spectral analysis of the surface roughness. Increasing the surface roughness using a Focused Ion Beam results also in an increase of the superficial critical current.
ISSN:2331-8422
DOI:10.48550/arxiv.0404332