Retracted: Study of the wettability of ZnO nanofilms

Retraction This article was mistakenly published twice. For this reason this duplicate article has now been retracted. For citation purposes please cite the original: http://www.inljournal.com/?_action=articleInfo&article=21 Al-doped and un-doped ZnO thin films deposited on quartz substrates by...

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Veröffentlicht in:International nano letters 2012-12, Vol.2 (1), p.1-4, Article 1
Hauptverfasser: Subedi, Deepak Prasad, Madhup, Dinesh Kumar, Sharma, Ashish, Joshi, Ujjwal Man, Huczko, Andrzej
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Sprache:eng
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Zusammenfassung:Retraction This article was mistakenly published twice. For this reason this duplicate article has now been retracted. For citation purposes please cite the original: http://www.inljournal.com/?_action=articleInfo&article=21 Al-doped and un-doped ZnO thin films deposited on quartz substrates by the nebulized spray pyrolysis method were studied to investigate the wettability of the surface. The main objective of the present study was to investigate the wettability of ZnO thin film by changing the concentration of Al doping. Microstructure and water contact angles of the films were measured by scanning electron microscopy (SEM) and using a contact angle goniometer. SEM studies revealed that the grain size within the film increases with the doping concentration. The contact angles were studied to see the effect of aluminum doping on the hydrophilicity of the film. ZnO films were found to be hydrophobic in nature. A good correlation was observed between the SEM micrographs and contact angle results. The nature of the film was found to change from being hydrophobic to hydrophilic after the treatment in low-pressure DC glow discharge plasma, which, however, was reversible with the storage time.
ISSN:2008-9295
2228-5326
DOI:10.1186/2228-5326-2-1