Photo-induced changes in nano-copper oxide for optoelectronic applications

Copper oxide (CuO) nanoparticles (NPs) have been prepared using microwave irradiation. A mother material was copper nitrate in distilled water. X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used for characterizing the NPs powders. Thermal Gravimetric Analysis (TGA) and Diff...

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Veröffentlicht in:Physica. B, Condensed matter Condensed matter, 2018-06, Vol.538, p.185-190
Hauptverfasser: Hendi, A.A., Rashad, M.
Format: Artikel
Sprache:eng
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Zusammenfassung:Copper oxide (CuO) nanoparticles (NPs) have been prepared using microwave irradiation. A mother material was copper nitrate in distilled water. X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used for characterizing the NPs powders. Thermal Gravimetric Analysis (TGA) and Differential Thermal Analysis (DTA) were measured for as-prepared CuO NPs. The obtained oxides NPs were confirmed produced during chemical precipitation by these characterizions. These NPs were dropped on top of glass substrate for measuring the optical characterizions. Both linear and nonlinear optical properties of the as-prepared CuO NP films were studied. The optical energy gap of the as-prepared CuO NP films is equal to 3.98 eV, which is higher than that of the bulk material. The effect of ultraviolet (UV) light irradiation on the CuO NP films was investigated at 2 and 5 h for study the photo-induced effect. The optical properties of CuO NP films were measured as a function of these UV irradiation time. The optical constants for as-prepared and irradiated CuO NP films were calculated which reflect the affect of UV irradiation time. As observed from these optical results, a highly forced for optoelectronic applications. •Thin films of CuO were deposited on glass substrate.•XRD and SEM results showed the aggumarted grains under irradiation effect.•A decreasing of the optical band gap of the films with irradiation is observed.•The present films are appropriated for optoelectronic applications.
ISSN:0921-4526
1873-2135
DOI:10.1016/j.physb.2018.03.035