Opto-magnetic imaging of neural network activity in brain slices at high resolution using color centers in diamond
We suggest a novel approach for wide-field imaging of the neural network dynamics of brain slices that uses highly sensitivity magnetometry based on nitrogen-vacancy (NV) centers in diamond. In-vitro recordings in brain slices is a proven method for the characterization of electrical neural activity...
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Veröffentlicht in: | arXiv.org 2017-08 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We suggest a novel approach for wide-field imaging of the neural network dynamics of brain slices that uses highly sensitivity magnetometry based on nitrogen-vacancy (NV) centers in diamond. In-vitro recordings in brain slices is a proven method for the characterization of electrical neural activity and has strongly contributed to our understanding of the mechanisms that govern neural information processing. However, traditional recordings can only acquire signals from a few positions simultaneously, which severely limits their ability to characterize the dynamics of the underlying neural networks. We suggest to radically extend the scope of this method using the wide-field imaging of the neural magnetic fields across the slice by means of NV magnetometry. Employing comprehensive computational simulations and theoretical analyses, we characterize the spatiotemporal characteristics of the neural magnetic fields and derive the required key performance parameters of an imaging setup based on NV magnetometry. In particular, we determine how the technical parameters determine the achievable spatial resolution for an optimal reconstruction of the neural currents from the measured field distributions. Finally, we compare the imaging of neural slice activity with that of a single planar pyramidal cell. Our results suggest that imaging of neural slice activity will be possible with the upcoming generation of NV magnetic field sensors, while imaging of the activity of a single planar cell remains more challenging. |
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ISSN: | 2331-8422 |