Structural, dispersion and optical functions studies of UV-irradiated erythrosine B thin films prepared by spin coating technique

XRD Diffraction measurements show that the powder of erythrosine B has poly-structure but very homogeneous thin films of erythrosine B have been successfully performed on a quartz substrate using the spin coating techniques and the structure of deposited films has been changed into amorphous form. T...

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2018-08, Vol.124 (8), p.1-8, Article 554
Hauptverfasser: Atwee, T., El-Mallah, H. M., Zeyada, H. M., El-Damhogi, D. G.
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Sprache:eng
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Zusammenfassung:XRD Diffraction measurements show that the powder of erythrosine B has poly-structure but very homogeneous thin films of erythrosine B have been successfully performed on a quartz substrate using the spin coating techniques and the structure of deposited films has been changed into amorphous form. The effect of UV radiation onto the erythrosine B thin films has been studied. XRD diffraction spectra indicate no influence of UV radiation upon the amorphous structure of erythrosine B thin films. The spectral behavior and optical properties of thin films were determined using spectrophotometric measurements of transmittance and reflectance in the wavelength range 200–2500 nm. Optical measurements of pristine and UV-irradiated erythrosine B films showed normal dispersion of the refractive index n at λ  > 850 nm and anomalous dispersion at λ  
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-018-1964-z