Synthesis of highly conductive thin-walled Al-doped ZnO single-crystal microtubes by a solid state method
•A solid state method for Al-doping of thin-walled ZnO microtubes.•The Zn2+ sites and Zn(0/−1) vacancies substituted by Al dopants.•The resistivity of ZnO:Al microtube down to ∼10−3 Ω·cm. ZnO has attracted considerable attention in fundamental studies and practical applications for the past decade d...
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Veröffentlicht in: | Journal of crystal growth 2018-06, Vol.491, p.97-102 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | •A solid state method for Al-doping of thin-walled ZnO microtubes.•The Zn2+ sites and Zn(0/−1) vacancies substituted by Al dopants.•The resistivity of ZnO:Al microtube down to ∼10−3 Ω·cm.
ZnO has attracted considerable attention in fundamental studies and practical applications for the past decade due to its outstanding performance in gas sensing, photocatalytic degradation, light harvesting, UV-light emitting/lasing, etc. The large-sized thin-walled ZnO (TW-ZnO) microtube with stable and rich VZn-related acceptors grown by optical vapor supersaturated precipitation (OVSP) is a novel multifunctional optoelectronic material. Unfortunately, the OVSP cannot achieve doping due to the vapor growth process. To obtain doped TW-ZnO microtubes, a solid state method is introduced in this work to achieve thin-walled Al-doping ZnO (TW-ZnO:Al) microtubes with high electrical conductivity. The morphology and microstructures of ZnO:Al microtubes are similar to undoped ones. The Al3+ ions are confirmed to substitute Zn2+ sites and Zn(0/−1) vacancies in the lattice of ZnO by EDS, XRD, Raman and temperature-dependent photoluminescence analyses. The Al dopant acting as a donor level offers massive free electrons to increase the carrier concentrations. The resistivity of the ZnO:Al microtube is reduced down to ∼10−3 Ω·cm, which is one order of magnitude lower than that of the undoped microtube. The present work provides a simple way to achieve doped ZnO tubular components for potential device applications in optoelectronics. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/j.jcrysgro.2018.03.041 |