Ultrathin Supported Lipid Monolayer with Unprecedented Mechanical and Dielectric Properties

The development of ultrathin dielectrics for low power electronics operations, flexible and printed electronics, and field‐effect‐transistor‐based sensors is still a challenge. Here, monolayers of engineered lipids supported on silicon are reported presenting exceptional mechanical and dielectric properties. The lipid monolayers are stabilized using a simple procedure based on a two‐stage reticulation process in both their aliphatic chains and their head‐group. With a thickness lower than 3 nm, such layers are demonstrated to offer exceptional mechanical and dielectric stability with unprecedented low leakage current and dielectric strength. Surprisingly, the mechanical and dielectric pressures required to rupture/breakdown the monolayers are shown to be similar. These results suggest the presence of a strong correlation between mechanical and dielectric properties, as well as between the mechanisms of rupture and breakdown. The development of ultrathin engineered lipid monolayers with exceptional mechanical and dielectric properties to be used as ultrathin dielectric is reported. The layers are obtained by a simple two‐stage reticulation process. A relationship between mechanical and dielectric performances is demonstrated.