Comparison of Conduction Mechanisms in Heavily Al-Doped 4H-SiC and Heavily Al- and N-Codoped 4H-SiC

The conduction mechanism in heavily Al-doped or heavily Al-and N-codoped p-type 4H-SiC epilayers was investigated. In both the singly-doped and codoped samples with an Al concentration (CAl) between 4x1019 and 2x1020 cm-3, band and nearest-neighbor hopping (NNH) conductions appeared in high and low...

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Veröffentlicht in:Materials science forum 2018-06, Vol.924, p.188-191
Hauptverfasser: Matsuura, Hideharu, Takeshita, Akinobu, Eto, Kazuma, Yoshida, Sadafumi, Okuda, Kazuya, Ji, Shi Yang, Kojima, Kazutoshi, Kato, Tomohisa, Okumura, Hajime, Imamura, Tatsuya, Hidaka, Atsuki, Takano, Kota
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Sprache:eng
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Zusammenfassung:The conduction mechanism in heavily Al-doped or heavily Al-and N-codoped p-type 4H-SiC epilayers was investigated. In both the singly-doped and codoped samples with an Al concentration (CAl) between 4x1019 and 2x1020 cm-3, band and nearest-neighbor hopping (NNH) conductions appeared in high and low temperature ranges, respectively. The codoping of N donors makes the NNH conduction dominant at temperatures higher than in the singly-doped samples. In both the singly-doped and codoped samples with CAl between 1x1019 and 4x1019 cm-3, an unexpected conduction appeared between the regions of the band and NNH conductions.
ISSN:0255-5476
1662-9752
1662-9752
DOI:10.4028/www.scientific.net/MSF.924.188