On the Nature of the Interface between Ag^sub 3^Sn Intermetallics and Sn in Sn-3.5Ag Solder Alloys

We report on the nature of the orientation of Ag^sub 3^Sn and the Ag^sub 3^Sn/Sn interface in Sn-3.5Ag solder. Orientation imaging microscopy (OIM) and transmission electron microscopy (TEM) were used to characterize the orientation and nature of the interface, respectively. OIM and TEM showed that...

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Veröffentlicht in:Journal of electronic materials 2007-12, Vol.36 (12), p.1615
Hauptverfasser: Sidhu, Rajen S, Madge, Shantanu V, Deng, Xin, Chawla, Nikhilesh
Format: Artikel
Sprache:eng
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Zusammenfassung:We report on the nature of the orientation of Ag^sub 3^Sn and the Ag^sub 3^Sn/Sn interface in Sn-3.5Ag solder. Orientation imaging microscopy (OIM) and transmission electron microscopy (TEM) were used to characterize the orientation and nature of the interface, respectively. OIM and TEM showed that Sn-3.5Ag containing spherical Ag^sub 3^Sn particles does not have a preferred orientation with respect to the Sn matrix. However, needle-like Ag^sub 3^Sn formed during slower cooling appeared to have a preferred orientation within individual Sn colonies. The interface between Sn and Ag^sub 3^Sn appeared to be incoherent, as confirmed by high-resolution TEM analysis. [PUBLICATION ABSTRACT]
ISSN:0361-5235
1543-186X