On the Nature of the Interface between Ag^sub 3^Sn Intermetallics and Sn in Sn-3.5Ag Solder Alloys
We report on the nature of the orientation of Ag^sub 3^Sn and the Ag^sub 3^Sn/Sn interface in Sn-3.5Ag solder. Orientation imaging microscopy (OIM) and transmission electron microscopy (TEM) were used to characterize the orientation and nature of the interface, respectively. OIM and TEM showed that...
Gespeichert in:
Veröffentlicht in: | Journal of electronic materials 2007-12, Vol.36 (12), p.1615 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | We report on the nature of the orientation of Ag^sub 3^Sn and the Ag^sub 3^Sn/Sn interface in Sn-3.5Ag solder. Orientation imaging microscopy (OIM) and transmission electron microscopy (TEM) were used to characterize the orientation and nature of the interface, respectively. OIM and TEM showed that Sn-3.5Ag containing spherical Ag^sub 3^Sn particles does not have a preferred orientation with respect to the Sn matrix. However, needle-like Ag^sub 3^Sn formed during slower cooling appeared to have a preferred orientation within individual Sn colonies. The interface between Sn and Ag^sub 3^Sn appeared to be incoherent, as confirmed by high-resolution TEM analysis. [PUBLICATION ABSTRACT] |
---|---|
ISSN: | 0361-5235 1543-186X |