P‐62: The Process and Characteristic of new High Thickness Negative Photoresist
In this paper, the process and characteristic of a new kind of high thickness negative photoresist were studied. Through process optimization, the 60~110um height post spacer (PS) was achieved successfully in 5.5G production line. The PS morphology was in good condition and the elastic recovery rate...
Gespeichert in:
Veröffentlicht in: | SID International Symposium Digest of technical papers 2018-05, Vol.49 (1), p.1433-1435 |
---|---|
Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | In this paper, the process and characteristic of a new kind of high thickness negative photoresist were studied. Through process optimization, the 60~110um height post spacer (PS) was achieved successfully in 5.5G production line. The PS morphology was in good condition and the elastic recovery rate could more than 90%.This paper also studied the influence on the PS at different dose quantity. The dose quantity had little influence on PS morphology, but a large effect on the elastic recovery rate. When the dose quantity was greater than 400mj, the elastic recovery rate could achieve the best state. |
---|---|
ISSN: | 0097-966X 2168-0159 |
DOI: | 10.1002/sdtp.12213 |