P‐62: The Process and Characteristic of new High Thickness Negative Photoresist

In this paper, the process and characteristic of a new kind of high thickness negative photoresist were studied. Through process optimization, the 60~110um height post spacer (PS) was achieved successfully in 5.5G production line. The PS morphology was in good condition and the elastic recovery rate...

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Veröffentlicht in:SID International Symposium Digest of technical papers 2018-05, Vol.49 (1), p.1433-1435
Hauptverfasser: Zhang, Jiaxiang, Wang, Yanqiang, Tong, Shuo, Zhou, Yongshan, Feng, Longqiang, Qing, Yifeng, Lu, Kai, Huang, Dongsheng, Chen, Si, Wang, Wei
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Sprache:eng
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Zusammenfassung:In this paper, the process and characteristic of a new kind of high thickness negative photoresist were studied. Through process optimization, the 60~110um height post spacer (PS) was achieved successfully in 5.5G production line. The PS morphology was in good condition and the elastic recovery rate could more than 90%.This paper also studied the influence on the PS at different dose quantity. The dose quantity had little influence on PS morphology, but a large effect on the elastic recovery rate. When the dose quantity was greater than 400mj, the elastic recovery rate could achieve the best state.
ISSN:0097-966X
2168-0159
DOI:10.1002/sdtp.12213