Development of 55” 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs

We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L...

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Veröffentlicht in:	Journal of the Society for Information Display 2018-01, Vol.26 (1), p.36-41
Hauptverfasser:	Noh, Ji Yong, Han, Dong Min, Jeong, Woo Cheol, Kim, Jong Woo, Cha, Soo Youle
Format:	Artikel
Sprache:	eng
Schlagworte:	Backplanes Circuit reliability gate driver IC GIP IGZO Indium gallium zinc oxide Integrated circuits OLED TV Organic light emitting diodes oxide semiconductor reliability short channel TFT
Online-Zugang:	Volltext
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