Development of 55” 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs
We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L...
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| Veröffentlicht in: | Journal of the Society for Information Display 2018-01, Vol.26 (1), p.36-41 |
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| container_title | Journal of the Society for Information Display |
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| creator | Noh, Ji Yong Han, Dong Min Jeong, Woo Cheol Kim, Jong Woo Cha, Soo Youle |
| description | We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.
We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs. |
| doi_str_mv | 10.1002/jsid.628 |
| format | Article |
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We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.</description><identifier>ISSN: 1071-0922</identifier><identifier>EISSN: 1938-3657</identifier><identifier>DOI: 10.1002/jsid.628</identifier><language>eng</language><publisher>Campbell: Wiley Subscription Services, Inc</publisher><subject>Backplanes ; Circuit reliability ; gate driver IC ; GIP ; IGZO ; Indium gallium zinc oxide ; Integrated circuits ; OLED TV ; Organic light emitting diodes ; oxide semiconductor ; reliability ; short channel TFT</subject><ispartof>Journal of the Society for Information Display, 2018-01, Vol.26 (1), p.36-41</ispartof><rights>Copyright 2018 Society for Information Display</rights><rights>2018 The Society for Information Display</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3978-56379c4ab901b20b60995a4327343afa944a172fe2f23b2be8267668b3c74ecb3</citedby><cites>FETCH-LOGICAL-c3978-56379c4ab901b20b60995a4327343afa944a172fe2f23b2be8267668b3c74ecb3</cites><orcidid>0000-0001-8930-0365</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fjsid.628$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fjsid.628$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids></links><search><creatorcontrib>Noh, Ji Yong</creatorcontrib><creatorcontrib>Han, Dong Min</creatorcontrib><creatorcontrib>Jeong, Woo Cheol</creatorcontrib><creatorcontrib>Kim, Jong Woo</creatorcontrib><creatorcontrib>Cha, Soo Youle</creatorcontrib><title>Development of 55” 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs</title><title>Journal of the Society for Information Display</title><description>We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.
We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.</description><subject>Backplanes</subject><subject>Circuit reliability</subject><subject>gate driver IC</subject><subject>GIP</subject><subject>IGZO</subject><subject>Indium gallium zinc oxide</subject><subject>Integrated circuits</subject><subject>OLED TV</subject><subject>Organic light emitting diodes</subject><subject>oxide semiconductor</subject><subject>reliability</subject><subject>short channel TFT</subject><issn>1071-0922</issn><issn>1938-3657</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp10L1OwzAQwPEIgUQpSDzCSSwsKY7t2PGImn4EKnUgZWCJnNRpXKVJiA1VNl6El-NJSFRWprvhp9Pp7zi3Hpp4COGHvdHbCcPBmTPyBAlcwnx-3u-Iey4SGF86V8bse8l8ykaODdWnKuvmoCoLdQ6-__P1DfQZNssQ1qtZCPErqENT1p2udmALBbqyqq1kCTtpFURTOGpbQKF3BbSq1DLVpbYdyGoLpqhbC1khq0qVEC3e1hDPY3PtXOSyNOrmb46dzXwWT5fuar2Ipo8rNyOCB67PCBcZlalAXopRypAQvqQEc0KJzKWgVHoc5wrnmKQ4VQFmnLEgJRmnKkvJ2Lk73W3a-v1DGZvs64_hdZNg5PE-DxW0V_cnlbW1Ma3Kk6bVB9l2iYeSoWkyNE36pj11T_SoS9X965Knlygc_C_NEHaq</recordid><startdate>201801</startdate><enddate>201801</enddate><creator>Noh, Ji Yong</creator><creator>Han, Dong Min</creator><creator>Jeong, Woo Cheol</creator><creator>Kim, Jong Woo</creator><creator>Cha, Soo Youle</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><orcidid>https://orcid.org/0000-0001-8930-0365</orcidid></search><sort><creationdate>201801</creationdate><title>Development of 55” 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs</title><author>Noh, Ji Yong ; Han, Dong Min ; Jeong, Woo Cheol ; Kim, Jong Woo ; Cha, Soo Youle</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3978-56379c4ab901b20b60995a4327343afa944a172fe2f23b2be8267668b3c74ecb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Backplanes</topic><topic>Circuit reliability</topic><topic>gate driver IC</topic><topic>GIP</topic><topic>IGZO</topic><topic>Indium gallium zinc oxide</topic><topic>Integrated circuits</topic><topic>OLED TV</topic><topic>Organic light emitting diodes</topic><topic>oxide semiconductor</topic><topic>reliability</topic><topic>short channel TFT</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Noh, Ji Yong</creatorcontrib><creatorcontrib>Han, Dong Min</creatorcontrib><creatorcontrib>Jeong, Woo Cheol</creatorcontrib><creatorcontrib>Kim, Jong Woo</creatorcontrib><creatorcontrib>Cha, Soo Youle</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>Journal of the Society for Information Display</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Noh, Ji Yong</au><au>Han, Dong Min</au><au>Jeong, Woo Cheol</au><au>Kim, Jong Woo</au><au>Cha, Soo Youle</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Development of 55” 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs</atitle><jtitle>Journal of the Society for Information Display</jtitle><date>2018-01</date><risdate>2018</risdate><volume>26</volume><issue>1</issue><spage>36</spage><epage>41</epage><pages>36-41</pages><issn>1071-0922</issn><eissn>1938-3657</eissn><abstract>We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.
We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.</abstract><cop>Campbell</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/jsid.628</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0001-8930-0365</orcidid><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| source | Access via Wiley Online Library |
| subjects | Backplanes Circuit reliability gate driver IC GIP IGZO Indium gallium zinc oxide Integrated circuits OLED TV Organic light emitting diodes oxide semiconductor reliability short channel TFT |
| title | Development of 55” 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs |
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