Anomalous Dependence of the Intensity of X-Ray Reflections of Cs2SO4 on the Crystallite Size and Shape
Detailed X-ray and electron microscopy analyses of Cs 2 SO 4 powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retaine...
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Veröffentlicht in: | Physics of the solid state 2018-02, Vol.60 (2), p.390-396 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Detailed X-ray and electron microscopy analyses of Cs
2
SO
4
powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed (
hkl
) reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample. |
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ISSN: | 1063-7834 1090-6460 |
DOI: | 10.1134/S1063783418020269 |