Anomalous Dependence of the Intensity of X-Ray Reflections of Cs2SO4 on the Crystallite Size and Shape

Detailed X-ray and electron microscopy analyses of Cs 2 SO 4 powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retaine...

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Veröffentlicht in:Physics of the solid state 2018-02, Vol.60 (2), p.390-396
Hauptverfasser: Shmyt’ko, I. M., Kedrov, V. V., Aronin, A. S.
Format: Artikel
Sprache:eng
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Zusammenfassung:Detailed X-ray and electron microscopy analyses of Cs 2 SO 4 powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed ( hkl ) reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.
ISSN:1063-7834
1090-6460
DOI:10.1134/S1063783418020269