On Designing Time-Censored Step-Stress Life Test for the Burr Type-XII Distribution

This article presents the optimal designing of time step-stress partially accelerated life test (PALT) under censored data from two-parameter Burr type-XII distribution. The maximum likelihood (ML) approach is used to obtain point and interval estimations of the model parameters. Moreover, optimum test plans for time step-stress PALT are optimally developed. The adopted optimality criterion is the minimization of the generalized asymptotic variance of the ML estimators of the model parameters. For illustration, numerical examples are presented.