Error probability independent delay analysis of single electronics circuits

Summary This study based on Poisson process and orthodox theory of single electron tunneling for the first time proposes an error probability independent delay model for delay calculation of single electronics circuits, involving multiple tunneling events. The Poisson process assumes that the tunneling events are independent of each other, but in real single electronics circuits they are correlated through space and time, so this effect has been considered and included in the proposed model. The dependence of tunneling rates on the logic transition is thoroughly investigated. Finally, the model is applied to different logic gates, and the result is compared with the well known Monte Carlo approach to prove the accuracy of the proposed model. This study based on Poisson process and orthodox theory of single electron tunneling proposes an error probability independent delay model for delay calculation of single electronics circuits, involving multiple tunneling events. Finally, the model is applied to different logic gates, and the result is compared with that obtained from master equation approach and Monte Carlo simulation. The result clearly shows that the proposed method outperforms the existing method not only in terms of simplicity but also in terms of accuracy.