Microwave dielectric properties of low-permittivity CaMgSiO4 ceramic

CaMgSiO 4 ceramic was synthesized via the conventional solid state reaction method and its phase composition, microstructure and microwave dielectric properties were studied. X-ray diffraction patterns showed that the ceramic was a single-phase and no other phase was observed. The CaMgSiO 4 ceramic could be well densified at 1350 °C for 4 h and exhibited favorable microwave dielectric properties with relative permittivity of 7.05, quality factor of 62,500 GHz and temperature coefficient of resonant frequency of −62.9 ppm/ o C. These results indicated that the CaMgSiO 4 ceramics might be a promising candidate for high-frequency devices fabrication.