Invariance of multifractal spectrums of spatial forms on the surface of ZnxCd1-xTe – Si heterocompositions synthesized by electron beam epitaxy and hot wall epitaxy

[Display omitted] •Surface of the ZnXCd1-XTe layers grown by the electron beam epitaxy and the hot wall epitaxy.•Multifractal analysis of surface nanoforms formed the surface relief of the ZnXCd1-XTe layers.•Comparison of MF spectrums of the layer surfaces obtained by different technologies. Multifr...

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Veröffentlicht in:	Journal of crystal growth 2017-10, Vol.475, p.144-149
Hauptverfasser:	Moskvin, P.P., Kryzhanivskyy, V.B., Rashkovetskyi, L.V., Rudnitskyi, V.A., Morozov, A.V., Lytvyn, P.M.
Format:	Artikel
Sprache:	eng
Schlagworte:	A1. Multifractal analysis A1. Self-similarity and self-organization A1. Surface structure Atomic force microscopy B1. Nanomaterials B2. II-VI semiconductor materials Cadmium zinc tellurides Chemical synthesis Electron beams Electrons Epitaxial growth Fractals Heterostructures Silicon substrates Studies
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