Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions
Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of dep...
Gespeichert in:
| Veröffentlicht in: | Frontiers of Optoelectronics (Online) 2017-09, Vol.10 (3), p.308-316 |
|---|---|
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 316 |
|---|---|
| container_issue | 3 |
| container_start_page | 308 |
| container_title | Frontiers of Optoelectronics (Online) |
| container_volume | 10 |
| creator | SAVENKOV, Sergey PRIEZZHEV, Alexander V. OBEREMOK, Yevgen SHOLOM, Sergey KOLOMIETS, Ivan |
| description | Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed. |
| doi_str_mv | 10.1007/s12200-017-0727-3 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_C6C</sourceid><recordid>TN_cdi_proquest_journals_1944611346</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cqvip_id>673690690</cqvip_id><sourcerecordid>1944611346</sourcerecordid><originalsourceid>FETCH-LOGICAL-c344t-18f579dfe70df30aa78df2bfe337e3f3c62791b5b4373827883425fdd6c58063</originalsourceid><addsrcrecordid>eNp9kE9LxDAQxYsouKz7AbwVPVeTTNu0R1n8Byte9uYhpE3SRrpNd9IF9dObUlk8LQzMwLzfm-FF0TUld5QQfu8pY4QkhPKEcMYTOIsWjJRZwnjOz49zVl5GK-9tRYCyHKDgi-hj3UqU9ajR_sjRuj52JraIUlk5ahX30nY-tn0cFDs_LZUeXCeD3PZN_HbQXacx3skR7VfY1W43OG8nJ38VXRjZeb3668to-_S4Xb8km_fn1_XDJqkhTceEFibjpTKaE2WASMkLZVhlNADXYKDOGS9plVUpcCgYLwpIWWaUyuusIDkso9vZdkC3P2g_ik93wD5cFLRM05xSSCcVnVU1Ou9RGzGg3Un8FpSIKUUxpyhCimJKUUBg2Mz4oO0bjf-cT0DFDLW2aTVqNaD2Xhh0_Wg1nkZv_n5sXd_sw8njkzmHvCSh4BdgmpMd</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1944611346</pqid></control><display><type>article</type><title>Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions</title><source>Springer Nature OA Free Journals</source><creator>SAVENKOV, Sergey ; PRIEZZHEV, Alexander V. ; OBEREMOK, Yevgen ; SHOLOM, Sergey ; KOLOMIETS, Ivan</creator><creatorcontrib>SAVENKOV, Sergey ; PRIEZZHEV, Alexander V. ; OBEREMOK, Yevgen ; SHOLOM, Sergey ; KOLOMIETS, Ivan</creatorcontrib><description>Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed.</description><identifier>ISSN: 2095-2759</identifier><identifier>EISSN: 2095-2767</identifier><identifier>DOI: 10.1007/s12200-017-0727-3</identifier><language>eng</language><publisher>Beijing: Higher Education Press</publisher><subject>Backscattering ; Biomedical Engineering and Bioengineering ; Decomposition ; Depolarization ; Electrical Engineering ; Engineering ; human nails ; Ionizing radiation ; ionizing radiation dose ; Mueller matrix ; Nails ; Physics ; Radiation dosage ; Research Article ; scattering ; Scattering angle ; Sensitivity analysis ; 去极化 ; 指甲 ; 散射模式 ; 散射波长 ; 矩阵分解 ; 表征 ; 辐射剂量 ; 辐照</subject><ispartof>Frontiers of Optoelectronics (Online), 2017-09, Vol.10 (3), p.308-316</ispartof><rights>Copyright reserved, 2017, Higher Education Press and Springer-Verlag Berlin Heidelberg</rights><rights>Higher Education Press and Springer-Verlag GmbH Germany 2017</rights><rights>Copyright Springer Science & Business Media 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c344t-18f579dfe70df30aa78df2bfe337e3f3c62791b5b4373827883425fdd6c58063</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://image.cqvip.com/vip1000/qk/71244X/71244X.jpg</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s12200-017-0727-3$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://doi.org/10.1007/s12200-017-0727-3$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27923,27924,41119,41487,42188,42556,51318,51575</link.rule.ids><linktorsrc>$$Uhttps://doi.org/10.1007/s12200-017-0727-3$$EView_record_in_Springer_Nature$$FView_record_in_$$GSpringer_Nature</linktorsrc></links><search><creatorcontrib>SAVENKOV, Sergey</creatorcontrib><creatorcontrib>PRIEZZHEV, Alexander V.</creatorcontrib><creatorcontrib>OBEREMOK, Yevgen</creatorcontrib><creatorcontrib>SHOLOM, Sergey</creatorcontrib><creatorcontrib>KOLOMIETS, Ivan</creatorcontrib><title>Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions</title><title>Frontiers of Optoelectronics (Online)</title><addtitle>Front. Optoelectron</addtitle><addtitle>Frontiers of Optoelectronics</addtitle><description>Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed.</description><subject>Backscattering</subject><subject>Biomedical Engineering and Bioengineering</subject><subject>Decomposition</subject><subject>Depolarization</subject><subject>Electrical Engineering</subject><subject>Engineering</subject><subject>human nails</subject><subject>Ionizing radiation</subject><subject>ionizing radiation dose</subject><subject>Mueller matrix</subject><subject>Nails</subject><subject>Physics</subject><subject>Radiation dosage</subject><subject>Research Article</subject><subject>scattering</subject><subject>Scattering angle</subject><subject>Sensitivity analysis</subject><subject>去极化</subject><subject>指甲</subject><subject>散射模式</subject><subject>散射波长</subject><subject>矩阵分解</subject><subject>表征</subject><subject>辐射剂量</subject><subject>辐照</subject><issn>2095-2759</issn><issn>2095-2767</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp9kE9LxDAQxYsouKz7AbwVPVeTTNu0R1n8Byte9uYhpE3SRrpNd9IF9dObUlk8LQzMwLzfm-FF0TUld5QQfu8pY4QkhPKEcMYTOIsWjJRZwnjOz49zVl5GK-9tRYCyHKDgi-hj3UqU9ajR_sjRuj52JraIUlk5ahX30nY-tn0cFDs_LZUeXCeD3PZN_HbQXacx3skR7VfY1W43OG8nJ38VXRjZeb3668to-_S4Xb8km_fn1_XDJqkhTceEFibjpTKaE2WASMkLZVhlNADXYKDOGS9plVUpcCgYLwpIWWaUyuusIDkso9vZdkC3P2g_ik93wD5cFLRM05xSSCcVnVU1Ou9RGzGg3Un8FpSIKUUxpyhCimJKUUBg2Mz4oO0bjf-cT0DFDLW2aTVqNaD2Xhh0_Wg1nkZv_n5sXd_sw8njkzmHvCSh4BdgmpMd</recordid><startdate>20170901</startdate><enddate>20170901</enddate><creator>SAVENKOV, Sergey</creator><creator>PRIEZZHEV, Alexander V.</creator><creator>OBEREMOK, Yevgen</creator><creator>SHOLOM, Sergey</creator><creator>KOLOMIETS, Ivan</creator><general>Higher Education Press</general><general>Springer Nature B.V</general><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>W92</scope><scope>~WA</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20170901</creationdate><title>Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions</title><author>SAVENKOV, Sergey ; PRIEZZHEV, Alexander V. ; OBEREMOK, Yevgen ; SHOLOM, Sergey ; KOLOMIETS, Ivan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c344t-18f579dfe70df30aa78df2bfe337e3f3c62791b5b4373827883425fdd6c58063</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Backscattering</topic><topic>Biomedical Engineering and Bioengineering</topic><topic>Decomposition</topic><topic>Depolarization</topic><topic>Electrical Engineering</topic><topic>Engineering</topic><topic>human nails</topic><topic>Ionizing radiation</topic><topic>ionizing radiation dose</topic><topic>Mueller matrix</topic><topic>Nails</topic><topic>Physics</topic><topic>Radiation dosage</topic><topic>Research Article</topic><topic>scattering</topic><topic>Scattering angle</topic><topic>Sensitivity analysis</topic><topic>去极化</topic><topic>指甲</topic><topic>散射模式</topic><topic>散射波长</topic><topic>矩阵分解</topic><topic>表征</topic><topic>辐射剂量</topic><topic>辐照</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SAVENKOV, Sergey</creatorcontrib><creatorcontrib>PRIEZZHEV, Alexander V.</creatorcontrib><creatorcontrib>OBEREMOK, Yevgen</creatorcontrib><creatorcontrib>SHOLOM, Sergey</creatorcontrib><creatorcontrib>KOLOMIETS, Ivan</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>中文科技期刊数据库-7.0平台</collection><collection>中文科技期刊数据库-工程技术</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>CrossRef</collection><jtitle>Frontiers of Optoelectronics (Online)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SAVENKOV, Sergey</au><au>PRIEZZHEV, Alexander V.</au><au>OBEREMOK, Yevgen</au><au>SHOLOM, Sergey</au><au>KOLOMIETS, Ivan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions</atitle><jtitle>Frontiers of Optoelectronics (Online)</jtitle><stitle>Front. Optoelectron</stitle><addtitle>Frontiers of Optoelectronics</addtitle><date>2017-09-01</date><risdate>2017</risdate><volume>10</volume><issue>3</issue><spage>308</spage><epage>316</epage><pages>308-316</pages><issn>2095-2759</issn><eissn>2095-2767</eissn><abstract>Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed.</abstract><cop>Beijing</cop><pub>Higher Education Press</pub><doi>10.1007/s12200-017-0727-3</doi><tpages>9</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 2095-2759 |
| ispartof | Frontiers of Optoelectronics (Online), 2017-09, Vol.10 (3), p.308-316 |
| issn | 2095-2759 2095-2767 |
| language | eng |
| recordid | cdi_proquest_journals_1944611346 |
| source | Springer Nature OA Free Journals |
| subjects | Backscattering Biomedical Engineering and Bioengineering Decomposition Depolarization Electrical Engineering Engineering human nails Ionizing radiation ionizing radiation dose Mueller matrix Nails Physics Radiation dosage Research Article scattering Scattering angle Sensitivity analysis 去极化 指甲 散射模式 散射波长 矩阵分解 表征 辐射剂量 辐照 |
| title | Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T11%3A40%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_C6C&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Characterization%20of%20irradiated%20nails%20in%20terms%20of%20depolarizing%20Mueller%20matrix%20decompositions&rft.jtitle=Frontiers%20of%20Optoelectronics%20(Online)&rft.au=SAVENKOV,%20Sergey&rft.date=2017-09-01&rft.volume=10&rft.issue=3&rft.spage=308&rft.epage=316&rft.pages=308-316&rft.issn=2095-2759&rft.eissn=2095-2767&rft_id=info:doi/10.1007/s12200-017-0727-3&rft_dat=%3Cproquest_C6C%3E1944611346%3C/proquest_C6C%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1944611346&rft_id=info:pmid/&rft_cqvip_id=673690690&rfr_iscdi=true |