Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions
Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of dep...
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Veröffentlicht in: | Frontiers of Optoelectronics (Online) 2017-09, Vol.10 (3), p.308-316 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed. |
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ISSN: | 2095-2759 2095-2767 |
DOI: | 10.1007/s12200-017-0727-3 |