Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions

Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of dep...

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Veröffentlicht in:Frontiers of Optoelectronics (Online) 2017-09, Vol.10 (3), p.308-316
Hauptverfasser: SAVENKOV, Sergey, PRIEZZHEV, Alexander V., OBEREMOK, Yevgen, SHOLOM, Sergey, KOLOMIETS, Ivan
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Sprache:eng
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Zusammenfassung:Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed.
ISSN:2095-2759
2095-2767
DOI:10.1007/s12200-017-0727-3