Investigation of the properties and formation process of a peculiar V-pit in HVPE-grown GaN film

•The SEM and CL images of a hexagonal V-pit are obviously different.•No defects or dislocations contribute to the formation of such a V-pit.•A kinetically limited growth process of GaN is demonstrated. Hexagonal V-pits with an inverted pyramid shape appear on the surface of a GaN film after etching...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Materials letters 2017-07, Vol.198, p.12-15
Hauptverfasser: Zhang, Min, Cai, Demin, Zhang, Yumin, Su, Xujun, Zhou, Taofei, Cui, Miao, Li, Chao, Wang, Jianfeng, Xu, Ke
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:•The SEM and CL images of a hexagonal V-pit are obviously different.•No defects or dislocations contribute to the formation of such a V-pit.•A kinetically limited growth process of GaN is demonstrated. Hexagonal V-pits with an inverted pyramid shape appear on the surface of a GaN film after etching by hot H3PO4. A regular structure that is different from the V-pit morphology is observed in the cathodoluminescence image. The carrier concentration and stress distributions are nonuniform inside the V-pit. Furthermore, no dominant dislocations or defects are observed in the facets or bottom area of the V-pits. An island coalescence process is considered to contribute to the formation of such V-pits, with the coalesced island facets changing from {101m} to {112m} at a concave state for the different growth velocities.
ISSN:0167-577X
1873-4979
DOI:10.1016/j.matlet.2017.03.170